Davis College of Agriculture, Natural Resources and Design
Forest Resource Management
A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.
Digital Commons Citation
Nan, Nan and Wang, Jingxin, "FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials" (2019). Faculty & Staff Scholarship. 1918.
Nan, N., & Wang, J. (2019). FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials. Advances in Materials Science and Engineering, 2019, 1–8. https://doi.org/10.1155/2019/8680715