Document Type

Article

Publication Date

1997

Source Citation

Lederman, D., Yu, Zhonghai., Myers, T. H., & Richards-Babb, M. R. (1997). Surface Morphology Of Gan Films Determined From Quantitative X-Ray Reflectivity. Applied Physics Letters, 71(3), 368-370. http://doi.org/10.1063/1.119539

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