Semester
Summer
Date of Graduation
2003
Document Type
Thesis
Degree Type
MS
College
Statler College of Engineering and Mineral Resources
Department
Lane Department of Computer Science and Electrical Engineering
Committee Chair
Bojan Cukic.
Abstract
In the last two decades, there has been a tremendous growth of biometric applications especially in security. Reliability of the biometric devices is extremely important.;This thesis discusses an approach for estimating the reliability of systems, which contain biometric user authentication subsystem. The ECRA (Early Component Based Reliability Assessment) tool utilizes an easy to use interface and employs the Bayesian algorithm to predict the system reliability. This application of the ECRA technique to biometrics is new. Using the UML diagrams and the ECRA tool, the reliability of the system is predicted.
Recommended Citation
Mahadevan, Karthikeyan, "Estimating reliability impact of biometric devices in large scale applications" (2003). Graduate Theses, Dissertations, and Problem Reports. 1352.
https://researchrepository.wvu.edu/etd/1352