Author

Ming Luo

Date of Graduation

2006

Document Type

Dissertation

Degree Type

PhD

College

Eberly College of Arts and Sciences

Department

Physics and Astronomy

Committee Chair

Nancy C. Giles

Committee Co-Chair

Larry E. Haliburton

Committee Member

Larry A. Hornak

Committee Member

David Lederman

Committee Member

Thomas H. Myers

Abstract

II-VI semiconductors doped with transitional-metal (TM) ions have received much research interest for applications such as broadly tunable mid-infrared lasers and saturable absorber for 1.5 μm eyesafe lasers. In this work, several characterization techniques including absorption, photoluminescence (PL), time-resolved photoluminescence (TRPL) and electron paramagnetic resonance (EPR) were applied to study some TM-ion-doped samples. These samples include a set of Cr-doped ZnTe epilayers prepared by the molecular-beam epitaxy technique (MBE) and seven bulk polycrystalline ZnSe samples doped with Fe and/or Co. The PL study in the visible region applied on the set of Cr-doped ZnTe film samples revealed the possible contaminants (e.g., arsenic, sodium and oxygen) in these samples. The infrared PL and lifetime results indicated that the ZnTe:Cr films grown at WVU are comparable in optical behaviors to the bulk samples. By monitoring the Cr2+-2μm emission, the optimum doping and growth parameters were determined to be [Cr]: mid-1018cm -3 and a Zn/Te beam equivalent pressure (BEP) ratio of 0.8. The optical investigations and EPR study applied on the polycrystalline bulk samples showed that divalent TM ions (Co2+ and Fe 2+) were successfully incorporated into the window-grade ZnSe materials, thus it is possible to prepare TM-ion-doped ZnSe samples with optical behaviors similar to that of single crystals by diffusion anneals. A detailed study on a ZnSe sample intentionally codoped with Fe and Co revealed the nonradiative energy transfer between Co2+ and Fe2+. This is the first clear report of energy transfer associated with divalent TM ions in II-VI semiconductors.

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