Semester

Summer

Date of Graduation

1999

Document Type

Thesis

Degree Type

MS

College

Statler College of Engineering and Mineral Resources

Department

Lane Department of Computer Science and Electrical Engineering

Committee Chair

Larry A. Hornak.

Abstract

Microelectromechanical systems (MEMS) have been the focus of many research groups because of their wide variety of uses in sensing and actuation applications. A fundamental barrier facing designers of next generation MEMS is the inability to access accurate, real-time microstructure positional information to determine if the device is performing as expected. Previously explored optical and electrical methods of MEMS device monitoring are often only suitable for research environments, or are unable to produce clear and meaningful characterization of device motion. The most desirable MEMS monitoring method would be one that could be implemented at the device level, which would allow the monitoring system to be fabricated along with the device itself. This research explores a through-wafer method of optically monitoring and characterizing the motion of a lateral comb resonator fabricated using the Multi-User MEMS Process Service (MUMPS). Positional monitoring results obtained from a 1.3 mum wavelength through-wafer optical probe are presented, as well as a method of device level implementation of the monitoring system.

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