Document Type
Article
Publication Date
2019
College/Unit
Davis College of Agriculture, Natural Resources and Design
Department/Program/Center
Forest Resource Management
Abstract
A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.
Digital Commons Citation
Nan, Nan and Wang, Jingxin, "FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials" (2019). Faculty & Staff Scholarship. 1918.
https://researchrepository.wvu.edu/faculty_publications/1918
Source Citation
Nan, N., & Wang, J. (2019). FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials. Advances in Materials Science and Engineering, 2019, 1–8. https://doi.org/10.1155/2019/8680715
Comments
Copyright © 2019 Nan Nan and Jingxin Wang. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.